CVE-2022-25697

EUVD-2022-30352
Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables
ProviderTypeBase ScoreAtk. VectorAtk. ComplexityPriv. RequiredVector
NISTPrimary
8.4 HIGH
LOCAL
LOW
NONE
CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
qualcommCNA
8.4 HIGH
LOCAL
LOW
NONE
CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Base Score
CVSS 3.x
EPSS Score
Percentile: 15%
Affected Products (NVD)
VendorProductVersion
qualcommsd_8_gen1_5g_firmware
-
qualcommsd429_firmware
-
qualcommsda429w_firmware
-
qualcommsdm429w_firmware
-
qualcommwcd9380_firmware
-
qualcommwcn3610_firmware
-
qualcommwcn3620_firmware
-
qualcommwcn3660b_firmware
-
qualcommwcn3680b_firmware
-
qualcommwcn3980_firmware
-
qualcommwcn6855_firmware
-
qualcommwcn6856_firmware
-
qualcommwcn7850_firmware
-
qualcommwcn7851_firmware
-
qualcommwsa8830_firmware
-
qualcommwsa8835_firmware
-
𝑥
= Vulnerable software versions
Common Weakness Enumeration
References
https://www.qualcomm.com/company/product-security/bulletins/december-2022-bulletin
https://www.qualcomm.com/company/product-security/bulletins/december-2022-bulletin