CVE-2024-53017

Memory corruption while handling test pattern generator IOCTL command.
ProviderTypeBase ScoreAtk. VectorAtk. ComplexityPriv. RequiredVector
NISTNIST
6.6 MEDIUM
LOCAL
LOW
LOW
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
qualcommCNA
6.6 MEDIUM
LOCAL
LOW
LOW
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
CISA-ADPADP
---
---
Base Score
CVSS 3.x
EPSS Score
Percentile: 3%
VendorProductVersion
qualcommsdm429w_firmware
-
qualcommsnapdragon_429_mobile_platform_firmware
-
qualcommwcn3620_firmware
-
qualcommwcn3660b_firmware
-
𝑥
= Vulnerable software versions