CVE-2024-53017
03.06.2025, 06:15
Memory corruption while handling test pattern generator IOCTL command.Enginsight
| Vendor | Product | Version |
|---|---|---|
| qualcomm | sdm429w_firmware | - |
| qualcomm | snapdragon_429_mobile_platform_firmware | - |
| qualcomm | wcn3620_firmware | - |
| qualcomm | wcn3660b_firmware | - |
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= Vulnerable software versions
Common Weakness Enumeration