CVE-2024-53017

EUVD-2024-54636
Memory corruption while handling test pattern generator IOCTL command.
ProviderTypeBase ScoreAtk. VectorAtk. ComplexityPriv. RequiredVector
NISTPrimary
6.6 MEDIUM
LOCAL
LOW
LOW
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
qualcommCNA
6.6 MEDIUM
LOCAL
LOW
LOW
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
Base Score
CVSS 3.x
EPSS Score
Percentile: 7%
Affected Products (NVD)
VendorProductVersion
qualcommsdm429w_firmware
-
qualcommsnapdragon_429_mobile_platform_firmware
-
qualcommwcn3620_firmware
-
qualcommwcn3660b_firmware
-
𝑥
= Vulnerable software versions
Common Weakness Enumeration
References
https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html